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Joint ALS/SSRL Workshop on X-ray microdiffraction
X-ray Microdiffraction and its Application to Problems
in Materials Science

October 18, 2000


X-ray diffraction using sub-micron white and monochromatic beams has been recently made possible by the development of high brilliance third generation synchrotron sources and progress in x-ray micro-focusing technologies. Among the many applications in the field of Materials Science and Technologies, the ability to probe single grains in thin film and patterned structures can provide structural and strain information not possible with other techniques. The purpose of the workshop is to present the possibilities now available using x-ray microbeams as a new characterization tool and to identify new potential applications and areas that would broaden the range of applicability of this technique.

Register for this Workshop via the ALS Users Meeting website.

   
Meeting Agenda: Organizers:
    9:00 Introduction to the Workshop
J. R. Patel and S. Brennan
Sean Brennan, SSRL
Nobumichi Tamura, ALS
Jim Patel, SSRL/ALS
    9:15 "Inhomogeneous Stress-Strain Issues in VLSI Interconnect Technology"
K.N. Tu, U.C. Los Angeles
    9:45 "X-Ray Diffraction and Microfluorescence Studies of Electromigration"
G. S. Cargill III, Lehigh University
 
    10:15 "Passivated Al test structures studied by X-ray Microdiffraction at the ALS"
N. Tamura, ALS
For more information about this workshop, contact:
    10:45 Break Nobumichi Tamura ntamura@lbl.gov 510-486-6189
    11:00 "Damascene Cu test structures studied by X-Ray Microdiffraction at the ALS"
R. Spolenak, Lucent Technologies
    11:30 "2D and 3D Investigations of Structure, Orientation, and Strain with Sub-Micron Resolution using White X-ray Microbeams"
B.C. Larson and G.E. Ice, ORNL
 
    12:00 "X-Ray Microtopography: deformation, mapping with Microbeams"
I.C. Noyan, IBM
 
    12:30 Lunch  
    1:30 "Instrumentation and Optics used for X-Ray Microdiffraction at the ALS"
A.A. MacDowell, ALS
    2:00 "Understanding Damage-induced Crack Formation and Propagation by the Application of Microdiffraction: Possibilities and Challenges"
B.L. Boyce and R.O. Ritchie, U.C. Berkeley
 
    2:20 (Title to be announced)
W. Panero, U.C. Berkeley
    2:40 "Application of Microdiffraction to the Identification of Microdivided Materials in Soils"
A. Manceau, U. Grenoble
 
    3:10 Break
    3:30 (Title to be announced)
C. Riekel, ESRF
 
    4:00

"Microdiffraction Studies using a Zone Plate-Based Microprobe"
B. Lai, APS

 
    4:30 Round Table Discussion  
         
         

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