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Alastair MacDowell

Advanced Light Source
Lawrence Berkeley National Lab
1 Cyclotron Road MS 2R0400
Berkeley, CA 94720

Tel: 510-486-4276
Fax: 510-486-7696
Email: AAMacDowell@lbl.gov


Research Interests and Project

    • Development and operation of X-ray micro-Tomography beamline 8.3.2
    • Development and operation of High Pressure X-ray Diffraction beamline 12.2.2
    • Environmental cells for synchrotron science
    • Coded aperture x-ray detection
    • X-ray optics and beamline design.

    Relevant Research Publications

    • “Real-time quantitative imaging of failure events in materials under load at temperatures above 1,600◦C”.  H.A. Bale, A Haboub , AA MacDowell , JR Nasiatka , DY Parkinso , BN Cox, DB Marshall and RO Ritchie: Nature Materials, 12,40-46 (2013)  DOI:10.1038/nmat3497


    • “Coded Aperture Imaging for Fluorescent X-rays”, A. Haboub ; A. A. MacDowell ; S. Marchesini ; D. Y. Parkinson. Proc. SPIE 8502, Advances in X-Ray/EUV Optics and Components VII, 850209 ( 2012); doi:10.1117/12.981244
    • “X-ray micro-Tomography at the Advanced Light Source”. A.A.MacDowell, D.Y.Parkinson, A.Haboub, E.Schaible, J.R.Nasiatka, C.A.Yee, J.R.Jameson, J.B.Ajo-Franklin, C.R.Brodersen,  A.J.McElron.  SPIE, Optics and Photonics Conf. Aug 12-16, (2012)  San Jose.  .  Proc. SPIE  8506, Developments in X-Ray Tomography VIII, 850618 ( 2012);   doi: 10.1117/12.930243
    • “Suite of three protein crystallography beamlines with single superconducting bend magnet as the source”.  AA MacDowell, RS Celestre, M Howells, W McKinney, J Krupnick, D Cambie, EE Domning, RM Duarte, N Kelez, DW Plate et al:. Journal of Synchrotron Radiation (2004), 11:447-455.
    • “Submicron X-ray diffraction”, AA MacDowell, RS Celestre, N Tamura, R Spolenak, B Valek, WL Brown, JC Bravman, HA Padmore, BW Batterman, JR Patel:. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment (2001), 467:936-943.
    • “Reduction Imaging at 14 nm using Multilayer-Coated Optics - Printing of Features Smaller than 0.1-µm”. JE Bjorkholm, J Bokor, L Eichner, RR Freeman, J Gregus, TE Jewell, WM Mansfield, AA MacDowell, EL Raab, WT Silfvast et al:. Journal of Vacuum Science & Technology B (1990), 8(6):1509-1513.
    amlines for hard x-rays
  • X-ray optics