·    SPIE_6704-15              "New Procedures for the Adjustment of Elliptically Bent Mirrors with the Long Trace Profiler."

·    SPIE_6704-07              "Binary pseudo-random grating as a standard test surface for measurement of modulation transfer functions of interferometric microscopes."

·    SPIE_6704-09              "Proposal for a Universal Test Mirror for Characterization of Slope Measuring Instruments."

·    SPIE_5921-18              "Cross-check of different techniques for two-dimensional power spectral density measurements of X-ray optics."

·    CLS Invited Talk           "New Era of Optical Metrology at the ALS."

·    Applied Optics-45-2006   "Surface roughness of stainless steel mirrors for focusing soft x-rays."

·    SPIE_6317_13              "Air Convection Noise of Pencil-beam Interferometer for Long Trace Profiler."

·    SPIE_6317_10              "Positioning Errors of Pencil-beam Interferometers for Long Trace Profilers."

·    APC000706                  "Global High-Accuracy Intercomparison of Slope Measuring Instruments."

·    SPIE_5858_10              "Two dimensional power spectral density measurements of X-ray optics with the Micromap interferometric microscope."

·    SPIE_6704-0J               "Flat Field Calibration of CCD Detector for Long Trace Profiler."

·    SPIE_5921_18              "Cross-check of differenct techniques for two-dimensional power spectral density measurements of x-ray optics."

·    SPIE_5858_34              "Elimination of 'ghost'-effect-related systematic errors in metrology of X-ray optics with a long trace profiler."

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