ESG Experimental Systems Group
Beamline 7.3.3 provides for the rapid collection of x-ray diffraction data with extremely high spatial resolution. The capabilities of the beamline include:
- High resolution mapping of:
- Grain orientation and structure
- Triaxial stress and strain
- Plastic deformation
- Phase distribution in heterogeneous samples
- Simultaneous collection of x-ray fluorescence data
- Rapid data collection via CCD detector
- In-situ probing of sample during heating, cooling, etc.
Beamline 7.3.3. characteristics:
- Elliptically bent ultrasmooth mirrors in a Kirkpatrick-Baez configuration provide micron to submicron x-ray spot size on the sample.
- High x-ray flux provided by synchrotron bend magnet source.
- Mirrors provide achromatic focusing, allowing the use of white x-ray beam (5-14 keV) for Laue diffraction.
- A 4-crystal Si(111) monochromator allows switching between white and monochromatic radiation while illuminating the same area of the sample.
- A high precision XY positioning stage allows scanning of the sample under the microbeam and collecting diffraction data at each step (Scanning x-ray microdiffraction).
- A MAR CCD detector provides collection of diffraction data from a large solid angle.
- Custom in-house software suite allows for automated data collection and analysis.
[click for larger image]
Schematic layout of Beamline 7.3.3 at the Advanced Light Source.