> ESG HOME
Berkeley Lab masthead Search Jobs Phone Book A-Z Index Berkeley Lab masthead
X-Ray Microdiffraction at the Advanced Light Source

Beamline publications by area of
interests

General beamline info:

'Submicron X-ray Diffraction' A.A.MacDowell, R.S.Celestre, N.Tamura, R.Spolenak, B.C. Valek, W.L.Brown, J.C.Bravman, H.A.Padmore, B.W.Batterman & J.R.Patel, Nuclear Instruments and Methods in Physics Research A 467-468 (2001) 936-943

'Submicron X-Ray Diffraction and its Applications to Problems in Materials and Environmental Science' N. Tamura; R. Spolenak, B.C. Valek; A. Manceau; M. Meier Chang; R.S. Celestre; A.A. MacDowell; H.A. Padmore and J.R. Patel; Review of Scientific Instruments 73 (2002) 1369-1372.

'Scanning X-ray Microdiffraction with submicron white beam for strain/stress and orientation mapping in thin films' N. Tamura, A.A. MacDowell, R. Spolenak, B.C. Valek, J. C. Bravman, W.L. Brown, R. S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel, J. of Synchrotron Radiation 10 (2003) 137-143.

‘Application of the White/Monochromatic X-ray m-Diffraction Technique to the Study of Texture and Triaxial strain at the Submicron Level’ P. Goudeau, N. Tamura, R. Spolenak and H.A. Padmore, Materials Science Forum 490-491 (2005) 672-677. ICRS7 (International Conference on Residual Stresses VII)‘High Spatial Resolution Stress Measurements using Synchrotron based Scanning X-Ray Microdiffraction with White or Monochromatic beam’ N. Tamura, H.A. Padmore and J.R. Patel, Materials Science & Engineering A 399 (2005) 92-98.

‘Scanning X-Ray Microdiffraction for Materials Science at the Advanced Light Source’ N. Tamura, B.C. Valek, A.A. MacDowell, R.S. Celestre, H.A. Padmore, R. Spolenak, and J.R. Patel, Proceedings of IMECE04, in press (2004)

Stress in Thin films:

Local microstructure and stress in Al(Cu) thin film structures studied by X-ray microdiffraction' B.C. Valek, N. Tamura, R. Spolenak; A.A. MacDowell; R.S. Celestre; H.A. Padmore; J.C. Bravman; B.W. Batterman; J.R. Patel, Mat. Res. Soc. Symp. Proc. 673 (2001) P7.7.1-P7.7.6

'High Resolution Microdiffraction Studies Using Synchrotron Radiation' R. Spolenak; N. Tamura; B.C. Valek; A.A. MacDowell; H.A. Padmore; W.L. Brown; T. Marieb; B.W. Batterman and J.R. Patel, in „ 6th International Workshop on Stress induced phenomena in metallization", American Institute of Physics Conference Proceedings, July 25-27, 2001 Cornell University, Ithaca, NY, 612 (2002) 217-28.

'High Spatial Resolution Grain Orientation and Strain Mapping in Thin Films using Polychromatic Submicron X-ray Diffraction' N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, R. Spolenak, W.L. Brown, T. Marieb, H. Fujimoto, B.W. Batterman and J.R. Patel, Appl. Phys. Lett. 80 (2002) 3724-3727.

‘A Comparison of X-Ray Microdiffraction and Coherent Gradient sensing in Measuring Discontinuous Curvatures in Thin Film-Substrate systems’ M.A. Brown, T.-S. Park, A. Rosakis, E. Ustundag, Y. Huang, N. Tamura and B.C. Valek. J. of Applied Mechanics, in press (2005).

Electromigration in Al interconnects:

'Grain Orientation and Strain Measurements in Sub-Micron wide Passivated Individual Aluminum Test Structures' N. Tamura, B. C. Valek, R. Spolenak, A. A. MacDowell, R. S. Celestre, H.A.Padmore, W. L. Brown, T. Marieb, J. C. Bravman, B. W. Batterman and J. R. Patel, Mat. Res. Soc. Symp. Proc., 612 (2001) D.8.8.1 –D8.8.6

'Electromigration-Induced Plastic Deformation in Passivated Metal Lines' B.C. Valek, J.C. Bravman, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, R. Spolenak, W.L. Brown, B.W. Batterman and J.R. Patel, Appl. Phys. Lett. 81 (2002) 4168-4170.

'Quantitative Analysis of Dislocation Arrangements induced by Electromigration in a passivated Al (0.5wt% Cu) Interconnect' R.I. Barabash, G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, R. Spolenak and J.R. Patel, J. Appl. Phys. 93 (2003) 5701-5706.

'Spatially Resolved Characterization of Electromigration-Induced plastic deformation in Al (0.5wt% Cu) interconnect' R.I. Barabash, G.E. Ice, N. Tamura, J.R. Patel, B.C. Valek, J.C. Bravman, R. Spolenak, Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures (Ed. D.A. Bonnell, J. Piqueras, A.P. Shreve, F. Zypman, 2-6 december 2002, Boston), Mat. Res. Soc. Symp. Proc. 738 (2003) G.13.1.1-7. pp. 345-50.

'Early Stage of Plastic Deformation in Thin Films Undergoing Electromigration' B. C. Valek, N. Tamura, R. Spolenak, W.A. Caldwell, J.C. Bravman, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.W. Batterman and J.R. Patel, J. Appl. Phys. 94 (2003) 3757-3761.

'Quantitative Characterization of Dislocation Structure Coupled with Electromigration in a Passivated Al (0.5wt% Cu) Interconnects' R.I. Barabash, N. Tamura, B.C. Valek, R. Spolenak, J.C. Bravman, G.E. Ice and J.R. Patel, 21-25 April 2003, San Francisco, Mat. Res. Soc. Symp. Proc. 766 (2003) 107-114.

‘Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect’ R.I. Barabash , G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, R. Spolenak, and J.R. Patel
Microelectronics Engineering 75 (2004) 24-30.

‘Coupling Between Precipitation and Plastic Deformation During Electromigration in a Passivated Al (0.5wt%Cu) Interconnect’ R.I. Barabash,  G.E. Ice, N. Tamura, B.C. Valek, R. Spolenak, J.C. Bravman, and J.R. Patel Materials, Technology and Reliability for Advanced Interconnects and low-k Dielectrics, MRS Proceedings, 812 (2004) F7.4.1-10. pp 351-60.

‘White beam analysis of coupling between precipitation and plastic deformation during electromigration in a passivated Al(0.5wt.% Cu) interconnect’ R.I. Barabash,  G.E. Ice, N. Tamura, B.C. Valek, J.C. Bravman, J.R. Patel, Metallofizica I Noveishie Tekhnologii 27 (2005) 75-94.

Electromigration In Cu interconnects:

'Microtexture and Strain in Electroplated Copper Interconnects' R. Spolenak, D.L. Barr, M.E. Gross, K. Evans-Lutherodt, W.L. Brown, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A.Padmore, J.R. Patel, B.C. Valek, J.C. Bravman, P. Flinn, T. Marieb, R.R. Keller, B.W. Batterman, Mat. Res. Soc. Symp. Proc., 612 (2001) D10.3.1-D.10.3.7

‘Unexpected Mode of Plastic Deformation in Cu Damascene Lines Undergoing Electromigration’ Arief S. Budiman, N. Tamura, B. C. Valek, K. Gadre, J. Maiz, R. Spolenak, W. A. Caldwell, W. D. Nix and J. R. Patel, Materials, Technology and Reliability for Advanced Interconnects and low-k Dielectrics, MRS Proceedings, 812 (2004) F7.3.1-6. pp. 345-50.

Thin film plasticity:

'Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction' R. Spolenak, W.L. Brown, N. Tamura, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.C. Valek, J.C. Bravman, T. Marieb, H. Fujimoto, B.W. Batterman, and J.R. Patel, Phys. Rev. Lett. 90 (2003) 096102-1-4.

‘X-ray microdiffraction: Local stress distributions in polycrystalline and epitaxial thin films’
M.A. Phillips, R. Spolenak, N. Tamura, W.L. Brown, A.A. MacDowell, R.S. Celestre, H.A. Padmore, B.W. Batterman, E. Arzt and J.R. Patel, Microelectronics Engineering 75 (2004) 117-126.

‘X-Ray Diffraction as a Probe for Elastic Strain: Micro- and Nanoscale Investigation of Thin Metal Films’ R. Spolenak, in Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, edited by Surita R. Bhatia, Peter G. Khalifah, Darrin J. Pochan, and Paolo G. Radaelli (Mater. Res. Soc. Symp. Proc. 840, Warrendale, PA , 2005), Q3.4.1-Q.4.11

Environmental Science:

'Trace metal fluxes to ferromanganese nodules from the western Baltic Sea as a record for long-term environmental changes' S. Hlawatsch; M. Kersten; C.D. Garbe-Schönberg; F. Lechtenberg; A. Manceau; N. Tamura; D.A. Kulik; J. Harff; and E. Suess, Chemical Geology, 182 (2002) 697-709.

'Deciphering Ni sequestration in soil ferromanganese nodules by combining x-ray fluorescence, absorption and diffraction at micrometer scales of resolution' A. Manceau, N. Tamura, M. A. Marcus, A.A. MacDowell, R.S. Celestre, R.E. Sublett, G.S. Sposito, H.A. Padmore, American Mineralogist 87 (2002) 1494-1499.

'Quantitative speciation of heavy metals in soils and sediments by synchrotron X-ray techniques' A. Manceau, M. A. Marcus, and N. Tamura, In Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science, (ed. P. A. Fenter, M. L. Rivers, N. C. Sturchio, and S. R. Sutton), Reviews in Mineralogy and Geochemistry, Mineralogical Society of America., Vol 49 (2002) 341-428.

'Molecular-Scale Speciation of Zn and Ni in Soil Ferromanganese Nodules from Loess Soils of the Mississippi Bassin' A. Manceau, N. Tamura, R.S. Celestre, A.A. MacDowell, N. Geoffroy, G. Sposito and H.A. Padmore, Environmental Science and Technology 37 (2003) 75-80.

'Zn speciation in a soil contaminated by the deposition of a dredged sediment by synchrotron x-ray techniques' M.-P. Isaure, A. Manceau, A. Laboudigue, N. Tamura, M.A. Marcus, J. de Physique IV, 107 (2003) 657-660.

'Natural speciation of Zn at the micrometer scale in a clayey soil using X-ray fluorescence, absorption, and diffraction' A. Manceau, M.A. Marcus, N. Tamura, O. Proux, N. Geoffroy and B. Lanson, Geochemica & Cosmochimica Acta 68 (2004) 2467-2483

‘Zinc mobility and speciation in soil covered by contaminated dredged sediment using micrometer-scale and bulk-averaging X-ray fluorescence, absorption and diffraction techniques’ M.-P. Isaure, A.Manceau, N. Geoffroy, A. Laboudigue, N. Tamura, M. A. Marcus, Geochim. and Cosmol. Acta 69 (2005) 1173-1198

‘Natural speciation of Mn, Ni and Zn at a micrometer scale in a clayey paddy soil using X-ray fluorescence, absorption and diffraction’ A. Manceau, C. Tommaseo, S. Rihs, N. Geoffroy, D. Chateigner, M. Schlegel, D. Tisserand, M. A. Marcus, N. Tamura, and Z.-S. Chen, Geochim. and Cosmol. Acta, 69 (2005) 4007-4034.

Electronic packaging:

'Structure and Kinetics of Sn Whisker Growth on Pb-free Solder Finish' W. J. Choi, T. Y Lee, K. N. Tu, N. Tamura, R. S. Celestre, A. A. MacDowell, Y. Y. Bong, L. G. T. T. Sheng, IEEE 52nd Electronic Component & Technology Conference Proceedings (IEEE Catalog number 02CH3734-5, 28-31 May 2002), San Diego, CA (2002) 628-633.

'Synchrotron radiation micro-diffraction study of Sn whiskers on Pb-free surface finish' W.J. Choi, T.Y. Lee, K.N. Tu, N. Tamura, R.S. Celestre, A.A. MacDowell, Y.Y. Bong and L. Nguyen, Acta Materialia 51 (2003) 6253-61.

‘Electromigration-induced microstructure evolution in tin studied by synchrotron X-ray microdiffraction’ Albert T. Wu, K. N. Tu, J. R. Lloyd, N. Tamura, B.C. Valek, C. R. Kao, Appl. Phys. Lett. 85 (2004) 2490-2492.

‘Synchrotron X-ray Micro-Diffraction Analysis on Microstructure Evolution in Sn Under Electromigration’ A.T.Wu, N. Tamura, J. R. Lloyd, C. R. Kao, and K.N. Tu, MRS Proceedings, 863, B9.10 MRS 2005 Spring Meeting

Thin film delamination:

'Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling' P. Goudeau, P. Villain, N. Tamura, R.S. Celestre and H.A. Padmore J.Phys IV France 12 (2002) 409-415.

'Macro Stress Mapping on Thin Film Buckling' P. Goudeau, P. Villain, P.-O. Renault, N. Tamura, R.S. Celestre, and H.A. Padmore Materials Science Forum, 404-407 (2002) 709-714.

'Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films' P. Goudeau, P. Villain, N. Tamura and H.A. Padmore, Appl. Phys. Lett. 83 (2003) 51-53.

'Elastic Properties of Supported Polycrystalline Thin Films and Multilayers : an X-ray Diffraction Study' P. Goudeau, P. Villain, N. Tamura, P.-O. Renault, K.F. Badawi and H. A. Padmore, Thermec’ 2003, Materials Science Forum 426-432 (2003) 3409-3414.

‘Evidence of plastic damage in thin films around buckling structures’ C. Coupeau, P. Goudeau, L. Belliard, M. George, N. Tamura, F. Cleymand, J. Colin, B. Perrin, and J. Grilhé. Thin Solid Films 469-470 (2004) 221-226.

Superconductivity:

'Microstructure and Pinning Properties of Hexagonal-disc shaped Single Crystalline MgB2' C.U. Jung, J.Y. Kim, P. Chowdhury, K.H.P. Kim, S-.I. Lee, D. S. Koh, N. Tamura, W.A. Caldwell, and J.R. Patel, Phys. Rev. B 66 (2002) 1845191-1845195.

'Microstructure and superconductivity of MgB2 single crystals' Kijoon H.P. Kim, C.U. Jung, B.W. Kang, Kyung Hee Kim, Hyun-Sook Lee, Sung-Ik Lee, N. Tamura, W.A. Caldwell and J.R. Patel, Current Applied Physics 4 (2004) 272-275.

'Shear At Twin Domain Boundaries in YBa2Cu3O7-x' W.A. Caldwell, N. Tamura, R.S. Celestre, A.A. MacDowell, H.A. Padmore, T.H. Geballe, G. Koster, B.W. Batterman and J.R. Patel, Phys. Rev. Lett. 21 (2004) 216105-1-4

Ferroelectric Materials:

'Direct Measurement of Triaxial Strain Fields around Ferroelectric Domains Using X-Ray Microdiffraction' R. C. Rogan, N. Tamura, G. A. Swift and E. Üstündag, Nature Materials 2 (2003) 379-381.

‘Multiscale Study of Internal Stress and Texture in Ferroelectrics’ E. Ustundag, R.C. Rogan, M.R. Daymond, N. Tamura, L. Margulies, and H. Poulsen, ICRS7 Materials Science Forum 490-491 (2005) p28

Fuel-Cell Materials:

'Twinning in La0.95Sr0.05Ga0.9Mg0.1O2.92 crystals studied by white beam (Laue) X-Ray Microdiffraction' D.Savytskii, D. Trots, L.Vasylechko, N.Tamura and M.Berkowski, J. Appl. Cryst. 36 (2003) 1197-1203.

Microelectromechanical Systems (MEMS):

'Correlation between X-ray micro-diffraction and a developed analytical model to measure residual stresses in suspended structures in MEMS' S. Rigo, P. Goudeau, J.-M. Desmarres, T. Masri, J.-A. Petit, P. Schmidt Microelectronics Reliability 43 (2003) 1963-1968.

‘Cartographie par diffraction des rayons X à l’échelle du micromètre des contraintes intragranulaires et des orientations cristallines d’un film d’or déposé sur une micro-poutre en silicium’
‘Micro scanning X-ray diffraction of residual stresses and grain orientation
in a gold thin film deposited on a poly silicon micro cantilever’

P. Goudeau, S. Rigo, T. Masri, J.-A. Petit, J.-M. Desmarres, N. Tamura, Materiaux & Techniques, No 3-4 (2004) 1-5. (SIRPE Editeur).

Deformation of Polycrystalline Materials:

‘In-situ Synchrotron X-Ray Microdiffraction Study of Lattice Rotation in Polycrystalline Materials during Uniaxial Deformations’ H.D. Joo, K.H. Kim, C.W. Bark, Y.M. Koo, and N. Tamura, AIP Conf. Proc. 705 (2004) 1094-1097. May 12, 2004. LBNL-55904
Synchrotron Radiation Instrumentation: 8th International Conference, Ed. T. Warwick et al., AIP, San Francisco CA, August 25-29, 2004

‘In situ synchrotron X-ray microdiffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations’ H.D. Joo, J.S. Kim, K.H. Kim, N. Tamura and Y.M. Koo, Scripta Materialia 51 (2004) 1183-1186.

‘Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation using a Synchrotron X-ray Source’ H.D. Joo, J.S. Kim, C.W. Bark, J.Y. Kim, Y.M. Koo, N. Tamura, Materials Science Forum 475-479 (2005) 4149-4152.

Deformation in BCC metals:

‘X-Ray Microdiffraction Characterization of Deformation Heterogeneities in BCC Crystals’ K.R. Magid, E.T. Lilleodden, N. Tamura, J.N. Florando, D.H. Lassila, M.M. Leblanc, R.I. Barabash, J.W. Morris Jr., in Neutron and X-Ray Scattering as Probes of Multiscale Phenomena, edited by Surita R. Bhatia, Peter G. Khalifah, Darrin J. Pochan, and Paolo G. Radaelli (Mater. Res. Soc. Symp. Proc. 840, Warrendale, PA , 2005), Q7.2.1-Q7.2.6

Archeology:

‘Micro scanning X-ray diffraction study of Gallo-Roman Terra Sigillata ceramics’ P. Sciau, P. Goudeau, N. Tamura and E. Dooryhee, Applied Physics A (2005)